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Hickman, Alexander P.

Mayo Clinic

Mayo Clinic

Citations 1

Application of the Reverse Pulse Technique for Worst Case Transient Analysis in HPC PDN Design
Smutzer, Chad M., Keuseman, Jordan R., Hickman, Alexander P., Haider, Clifton R. , Hickman, Alexander P.

2024 IEEE 33rd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) | November 21, 2024 | Volume: No volume available | Issue: No issue available | Pages: 1-3

10.1109/epeps61853.2024.10754562 Get It